Head and Torso Simulators (HATS)
Designed to measure and improve performance and accuracy of telecom and smart devices, our Head and Torso Simulators (HATS) comply with the high requirements and standards for speech recognition. Our simulators accurately match the characteristics of a human voice sound-field, and gives reproducible measurement results ensuring product performance and customers satisfaction.
High-Frequency HATS Type 5128
Capable of both issuing voice commands and measuring smart speaker response (full frequency range up to 20 kHz) makes fully automated testing of smart speakers and other voice operated devices possible.
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TYPE 5128
신제품 고주파수 HATS는 사람과 똑같은 외이도를 갖고 있기 때문에 전체 주파수 범위에서 정확한 음향 임피던스를 구현할 수 있습니다. 따라서 최대 20 kHz의 오디오 테스트에서는 이전과 다른 높은 정밀도를 보장합니다.
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TYPE 4128-D
Head and Torso Simulator (HATS) With handset positioner
Designed to be used in-situ electroacoustics tests on, for example, telephone handsets, headsets, audio conference devices, microphones, headphones, hearing aids, hearing protectors and smart speakers. Includes Handset Positioner Type 4606 for accurate positioning of telephone handsets.
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TYPE 4128-C
전화, 헤드셋, 오디오 회의 장치, 마이크, 헤드폰, 보청기 및 청각보호기에 대한 인시투(in-situ) 전기 음향 시험을 사용하도록 설계되었습니다.
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TYPE 4100
Sound Quality Head and Torso Simulator
Manikin designed for recording in-vehicle noise for sound quality evaluation and testing. Also used for sound optimisation of consumer appliances, office equipment, power tools, marine equipment and heavy machinery.
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DZ-9769 + DZ-9770
Symmetrical pinnae for Head and Torso Simulator
These symmetrical pinnae comply with ITU-T Rec. P.58, IEC 60318-7 and ANSI S3.36-1985, including testing of headphones and hearing protectors as well as measurements on telephones, hands-free communication devices and hearing aids.
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DZ-9773 and DZ-9774
Pinnae with tapered ear canal enable easy mounting of earbuds on our Head and Torso Simulator (HATS). With a slightly modified ear canal entrance, the shape of the pinnae is conically merged with a cylinder, making it easy to seal earbuds during tests.